Thin film measurement using Quintasonic T for semiconductors
Support for film thickness measurement of thin films in semiconductor manufacturing.
In the semiconductor industry, accurate thickness measurement of thin films is essential for product quality control. The thickness of thin films directly affects device performance, necessitating precise measurement and management. Variability in film thickness can lead to reduced yield and product defects. The QuintoSonic T measures the thickness of up to 8 layers non-destructively, supporting quality control in semiconductor manufacturing. 【Application Scenarios】 - Measurement of thin films on semiconductor wafers - Measurement of coating thickness - Quality control of thin film devices 【Benefits of Implementation】 - Reduced inspection time through non-destructive measurement - Management of multilayer films with thickness measurement of up to 8 layers - Improved data management through data output in EXCEL format and PDF report generation
- 企業：SANKO ELECTRONIC LABORATORY CO.,LTD.
- 価格：Other
